|
Our VisionGaugeŽ Online
Automated Optical Inspections Systems (AOI Systems) are high
accuracy tools for automated defect detection, measurement, and
inspection. In the semiconductor manufacturing industry, thorough final
inspection of wafers is a critical part of the production process; our
AOI systems are designed to help you obtain the best results possible.
These systems are highly capable
when dealing with great magnification, and they posses accuracy up to
0.1 micron. These systems are fully automated and can be programmed to
move in a three-dimensional set of coordinates. Furthermore, you can
use the system manually with the help of a joystick through our easy to
use VisionGaugeŽ Online machine vision software.
VisionGaugeŽ Online includes many
features to make your automated flaw detection and semiconductor wafer inspection
effective and efficient. You can easily create your own programs using
VisionGaugeŽ OnLine to teach the machine how to perform the inspection.
The software is capable of auto-focus, which provides you with accurate
and highly repeatable results. In addition, VisionGaugeŽ Online's
auto-scan tool is capable of automatically detecting any flaws on the
wafer. These systems are available with reflected or direct lighting.
You can automatically save
measurement and inspection results, save the images for "Pass" or
"Fail" parts of the wafer, control input and output signals based on
inspection results, and even automatically create reports with this
information. For any semiconductor wafer inspection and flaw detection needs,
VisionGaugeŽ software and systems are right for you.
Automated
Optical Inspection Systems - AOI Systems
High-speed,
High-Accuracy AOI Systems | 
