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Probe cards are
equipment used to test and benchmark semiconductor wafers. The
thousands of sensitive probe needles present on a probe card can be
placed as close as 20 microns apart and need to be placed precisely for
the probing process to be successful. Our VisionGaugeŽ
OnLine's Automated
Optical Inspection (AOI) systems can carry out probe
card measurement with great accuracy.
Our measurement systems are
assembled with
different levels of magnification, and they posses motion encoder
accuracy up to 0.1 micron in three dimensions. VisionGaugeŽ Online
systems are
easy to use and can be programmed so the inspection is
fully automated, or you can use the system manually with the help of a
joystick.
VisionGaugeŽ
Online includes many features to make your automated
measurements effective and efficient. The software is capable of
auto-focus, which provides you with accurate and highly repeatable
results. These systems are also customizable with reflected or direct
lighting.
You can automatically save
measurement results, save the images with measurement tags attached to
them, control input and output signals based on inspection results, and
even automatically create reports with this information. For any type
of probe card measurement application, VisionGaugeŽ Online machine
vision systems are right for you. For more information, please contact us. | 
